【摘要】 SoC测试面临的挑战之一是测试数据量过大,而测试数据压缩是应对这一挑战行之有效的方法。因此,提出了一种新的双游程交替的测试数据压缩方法,该方法对测试集中0游程和1游程交替编码,并且后一游程类型可以根据前一游程类型转变得到。这样在代码字中不需要表示游程类型,减少了游程所需代码字的长度。实验结果表明,该方法能够取得比同类方法更高的压缩率,而且解压结构简单,因此能够达到降低测试成本的目标。更多还原

【Abstract】 The large amount of test data is one of the challenges in SoC test,and the test data compression is an effective method to deal with this challenge.A new test data compression method of a dual run length alternating compression was presented.0run length and 1run length can be coded alternately,and the type of next run length can be obtained according to the previous run length type.So the type of run length is not represented in code words,and hence the length of the needed code word is reduced.Experimental results show that the method can achieve higher compression ratio compared with the similar method,and decompression structure is very simple,so the goal of reducing the cost of test can be achieved.更多还原