【摘要】 对超大规模集成电路进行随机测试的测试码之间的距离作了定量分析,在此基础上,改进了最大距离随机测试算法中测试码的生成方法,使得所生成的伪随机测试码集合同时达到最大海明距离与近似最大笛卡尔距离。因此每一个测试码可以尽可能多地独立检测到更多不重复的故障。进而提出了准完全最大距离测试新算法的思想和构建理论,并详细阐述了该算法的执行流程。在ISCAS’85基准电路上进行的大量实验数据分析表明,本方法确实有效地提高了随机测试效率,降低了随机测试成本。更多还原

【Abstract】 This paper improved maximum distance random testing essentially based on quantitative analysis of the maximum distance between two test patterns in pseudorandom testing for VLSI.The test sequence generated by the proposed algorithm,called quasi-perfect maximum distance testing algorithm,can reach both maximum Hamming distance and quasi-maximum Cartesian distance so that each test pattern may detect as many different faults as possible.The idea of this algorithm for generating the new test sequence was described in detail.Experiment results on ISCAS’85benchmarks indicate that this approach can highly increase the efficiency of pseudo random testing.更多还原