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几种电子设备密封失效原因分析及改进措施

Analysis and Modification on Seal Failure of Several Electronic Equipments

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【作者】 吕强

【Author】 LV Qiang;No.36 Research Institute of CETC;

【机构】 中国电子科技集团公司第三十六研究所

【摘要】 对几种电子设备密封失效的原因进行了分析,改进措施经试验验证有效。分析和试验结果表明:车载设备采用敞开式结构有利于空气流动,可有效避免交变湿热试验时设备内部产生积水;有浸渍要求的设备,其表面安装螺孔不宜采用涂胶密封方式;采用端面密封的设备,盖板必须具有足够的刚度才能保证橡胶密封圈压缩量在合理范围之内。

【Abstract】 The root cause of the seal failure of several electronic equipments was analyzed, and the modifications were proved to be effective through experiments. The analysis and experimental results indicates that open structure is propitious to air fluxion and can avoid water produced inside during damp heat test; for dipping equipments, the fixing screw on surface sealed with sealant is inadvisable; for end seal equipments, the cover board must be stiff enough to make the value compressed of rubber seal ring in reason range.

【关键词】 电子设备密封结构密封失效有限元
【Key words】 electronic equipmentseal structureseal failureFEM
  • 【文献出处】 环境技术 ,Environmental Technology , 编辑部邮箱 ,2014年01期
  • 【分类号】TH136
  • 【被引频次】3
  • 【下载频次】77
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