【摘要】 针对第三代半导体微波器件产品成熟度评估的迫切需求和国内外现有成熟度评估方法在客观性、全面性等方面的不足,从技术集成度和技术维度两个角度对传统技术成熟度(TRL)评价方法进行了全面扩展,建立了产品成熟度结构化的描述与度量模型,利用层次分析(AHP)、属性数学等原理提出了专家调查问卷形式下的产品成熟度定量计算方法,并构建了基于Web的第三代半导体微波器件产品成熟度评估系统,实现了全面客观高效的产品成熟度评估.更多还原

【Abstract】 With the exigent need of product maturity level evaluation for the third generation semiconductor microwave device and the shortage of current domestic and foreign evaluation methods, this paper extends the traditional Technology Readiness Level(TRL) evaluation method roundly from technical integration and technical dimension, establishes a structural describe and measure model for product maturity, proposes a quantitative computing method based on questionnaire using Analytic Hierarchy Process(AHP) and attribute mathematics, builds a product maturity level evaluation system for the third generation semiconductor microwave device based on Web, and at last realizes an all-round evaluation of product maturity objectively and effectively.更多还原