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Design of transverse magnetic-reflected polarizing film

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【作者】 李松权高来勖刘书钢柳春郁黄妍叶红安

【Author】 Songquan Li;Laixu Gao;Shugang Liu;Chunyu Liu;Yan Huang;Hongan Ye;School of Electronic Engineering, Heilongjiang University;

【机构】 School of Electronic Engineering, Heilongjiang University

【摘要】 We propose a wideband transverse magnetic-reflected polarizing film composed of Cr and SiO2. Based on the polarization characteristics of reflected light from Cr/SiO2 film, the film can serves as a polarizer to severely attenuate the transverse electric(TE)-polarized light and reflect the transverse magnetic(TM)-polarized light in a wavelength range from 600 to 900 nm. By suitably choosing the film thicknesses, the operation angles of such polarizers can be adjusted over a wide angle range greater than the critical angle of total reflection. Cr/SiO2 film has potential use in surface plasmon resonance(SPR) sensors based on Kretchmann configuration to form integrated structures.

【Abstract】 We propose a wideband transverse magnetic-reflected polarizing film composed of Cr and SiO2. Based on the polarization characteristics of reflected light from Cr/SiO2 film, the film can serves as a polarizer to severely attenuate the transverse electric(TE)-polarized light and reflect the transverse magnetic(TM)-polarized light in a wavelength range from 600 to 900 nm. By suitably choosing the film thicknesses, the operation angles of such polarizers can be adjusted over a wide angle range greater than the critical angle of total reflection. Cr/SiO2 film has potential use in surface plasmon resonance(SPR) sensors based on Kretchmann configuration to form integrated structures.

【基金】 supported by the National Natural Science Foundation of China(No.61177079);the Young Scientists Fund of the National Natural Science Foundation of China(No.61205071.)
  • 【文献出处】 Chinese Optics Letters ,中国光学快报(英文版) , 编辑部邮箱 ,2014年05期
  • 【分类号】O484.4;O436.3
  • 【被引频次】2
  • 【下载频次】35
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