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The determination of the thickness and the optical dispersion property of gold film using spectroscopy of a surface plasmon in the frequency domain

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【作者】 黄妍叶红安李松权窦寅丰

【Author】 Huang Yan,Ye Hong-An,Li Song-Quan,and Dou Yin-Feng School of Electronic Engineering,Heilongjiang University,Harbin 150080,China

【机构】 School of Electronic Engineering,Heilongjiang University

【摘要】 We propose to use wavelength modulation approach,i.e.,the spectroscopy of a surface plasmon in the frequency domain,to characterize the optical dispersion property of gold film.Using this method,we determine the dispersion relationship of gold film in a wavelength range from 537.12 nm to 905.52 nm,and our results accord well with the reported results by other authors.This method is particularly suited for studying the optical dispersion properties of thin metal films,because a series of dielectric constants over a wide spectral range can be determined simultaneously via only a single scan of the incident angle,thereby avoiding the repeated measurements required when using the angular modulation approach.

【Abstract】 We propose to use wavelength modulation approach,i.e.,the spectroscopy of a surface plasmon in the frequency domain,to characterize the optical dispersion property of gold film.Using this method,we determine the dispersion relationship of gold film in a wavelength range from 537.12 nm to 905.52 nm,and our results accord well with the reported results by other authors.This method is particularly suited for studying the optical dispersion properties of thin metal films,because a series of dielectric constants over a wide spectral range can be determined simultaneously via only a single scan of the incident angle,thereby avoiding the repeated measurements required when using the angular modulation approach.

【基金】 Project supported by the National Natural Science Foundation of China (Grant No. 61177079);the Open Fund of Key Laboratory of Electronics Engineering,College of Heilongjiang Province,China (Grant No. DZZD20100014);the Youth Science Foundation of Heilongjiang University,China (Grant No. QL200914)
  • 【文献出处】 Chinese Physics B ,中国物理B , 编辑部邮箱 ,2013年02期
  • 【分类号】TN25
  • 【被引频次】2
  • 【下载频次】57
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