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基于T-K控制图的多品种生产模式统计过程控制方法

Statistical process control method based on T-K control chart in multi-variety manufacturing environments

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【作者】 顾铠贾新章游海龙张士红

【Author】 GU Kai;JIA Xin-zhang;YOU Hai-long;ZHANG Shi-hong;National Key Laboratory of Fundamental Science for Wide Band-Gap Semiconductor Technology,School of Microelectronics,Xidian University;

【机构】 西安电子科技大学微电子学院国家宽禁带半导体重点实验室

【摘要】 根据SPC基本原理,传统的统计过程控制技术无法直接用于多品种生产环境的质量监控.提出了一种新颖的统计过程控制方法,对工艺参数均值及标准偏差监控,仅需一张控制图即可对多品种生产过程的运行状态做出评价.详细给出了T、K统计量的定义和计算方式及T-K控制图控制限的确定.理论分析表明,T-K控制图具有稳定的监控性能且具有self-starting特点.通过实例分析及仿真验证,证实该过程控制方法能够及时、有效地检测出多品种生产模式下导致生产过程失控的异常因素,提示操作人员适时做出响应,使生产过程维持在统计受控状态以保证产品质量.

【Abstract】 According to the basic principle of SPC,it is not proper to conduct quality control using traditional statistical process control technology in multi-variety manufacturing environments.In this paper,a novel process control method is proposed.By this technology the process running state can be evaluated to monitor either characteristics mean or standard deviation by only one chart respectively.The definition and calculation method for T and K statistics and control limits for T-K control chart are suggested and explained in detail.After theoretical analysis,it is shown that T-K chart has characteristic of self-starting and stable capability for monitoring process.The application example and simulation results indicate that the proposed T-K chart can detect abnormal cause immediately and effectively in multi-variety manufacturing system,and remind the operators to react to keep the process in-control and ensure the product quality.

  • 【文献出处】 系统工程理论与实践 ,Systems Engineering-Theory & Practice , 编辑部邮箱 ,2013年10期
  • 【分类号】TB497
  • 【被引频次】16
  • 【下载频次】352
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