节点文献

Impact of Au Nanocrystal Size and Inter-Nanocrystal Distance on the Storage Characteristics of Memory Devices

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 蓝学新欧欣徐波龚昌杰李润殷乔楠夏奕东殷江刘治国李爱东闫锋

【Author】 LAN Xue-Xin;OU Xin;XU Bo;GONG Chang-Jie;LI Run;YIN Qiao-Nan;XIA Yi-Dong;YIN Jiang;LIU Zhi-Guo;LI Ai-Dong;YAN Feng;National Laboratory of Solid State Microstructures,and Department of Physics,Nanjing University;National Laboratory of Solid State Microstructures,and Department of Materials Science and Engineering,Nanjing University;School of Electronics Science and Engineering,Nanjing University;

【机构】 National Laboratory of Solid State Microstructures,and Department of Physics,Nanjing UniversityNational Laboratory of Solid State Microstructures,and Department of Materials Science and Engineering,Nanjing UniversitySchool of Electronics Science and Engineering,Nanjing University

【摘要】 The charge-storage characteristics of charge trapping memory devices containing different sizes of Au nanocrystals(NCs)sandwiched by Al2O3 tunneling and blocking layers are studied.A strong impact of both Au NC size and inter-NC distance on the charge trapping capability of the devices is observed.The total surface area of Au NCs associated with Au NC size is supposed to be a key factor in the charge-storage capability,and the device with larger size of Au NCs and a suitable inter-NC distance will possess better charge trapping capability.Variable range hopping as the lateral charge loss mechanism is considered as the main reason for the decrease of the charge trapping capability when Au NCs grow and overlap neighbors.

【Abstract】 The charge-storage characteristics of charge trapping memory devices containing different sizes of Au nanocrystals(NCs) sandwiched by Al2O3 tunneling and blocking layers are studied.A strong impact of both Au NC size and inter-NC distance on the charge trapping capability of the devices is observed.The total surface area of Au NCs associated with Au NC size is supposed to be a key factor in the charge-storage capability,and the device with larger size of Au NCs and a suitable inter-NC distance will possess better charge trapping capability.Variable range hopping as the lateral charge loss mechanism is considered as the main reason for the decrease of the charge trapping capability when Au NCs grow and overlap neighbors.

【基金】 Supported by the National Natural Science Foundation of China under Grant No 61176124;the National Basic Research Program of China under Grant No 2010CB934201;the Priority Academic Program Development of Jiangsu Higher Education Institutions
  • 【文献出处】 Chinese Physics Letters ,中国物理快报(英文版) , 编辑部邮箱 ,2013年12期
  • 【分类号】TP333
节点文献中: 

本文链接的文献网络图示:

本文的引文网络