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Phase Shift of Polarized Light after Transmission through a Biaxial Anisotropic Thin Film

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【作者】 侯永强李煦何凯齐红基易葵邵建达

【Author】 HOU Yong-Qiang;LI Xu;HE Kai;QI Hong-Ji;YI Kui;SHAO Jian-Da;Key Laboratory of Materials for High Power Laser,Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences;University of Chinese Academy Sciences;

【机构】 Key Laboratory of Materials for High Power Laser,Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of SciencesUniversity of Chinese Academy Sciences

【摘要】 Based on the theoretical analysis of biaxial birefringent thin films with characteristic matrix method,we investigate the phase shift on transmission of a tilted columnar biaxial film at normal and oblique incidence over300-1200 nm for s-and p-polarized waves.Compared with the simplified calculation method,the interference effects of the birefringent thin film are considered to yield more accurate results.The quarter wavelength phase shift calculated with the characteristic matrix method is consistent with that monitored with in situ measurement by two-angle ellipsometry,which validates our complied program for the calculation of the phase shift of the biaxial anisotropic thin film.Furthermore,the characteristic matrix method can be easily used to obtain continuous adjustable phase retardation at oblique incidence,whereas the simplified calculation method is valid for the case of normal incidence.A greater generality and superiority of the characteristic matrix method is presented.

【Abstract】 Based on the theoretical analysis of biaxial birefringent thin films with characteristic matrix method,we investigate the phase shift on transmission of a tilted columnar biaxial film at normal and oblique incidence over300-1200 nm for s-and p-polarized waves.Compared with the simplified calculation method,the interference effects of the birefringent thin film are considered to yield more accurate results.The quarter wavelength phase shift calculated with the characteristic matrix method is consistent with that monitored with in situ measurement by two-angle ellipsometry,which validates our complied program for the calculation of the phase shift of the biaxial anisotropic thin film.Furthermore,the characteristic matrix method can be easily used to obtain continuous adjustable phase retardation at oblique incidence,whereas the simplified calculation method is valid for the case of normal incidence.A greater generality and superiority of the characteristic matrix method is presented.

【基金】 Supported by the National Natural Science Foundation of China under Grant No 61205211
  • 【文献出处】 Chinese Physics Letters ,中国物理快报(英文版) , 编辑部邮箱 ,2013年01期
  • 【分类号】O484.41;O436.3
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