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一种解决超薄切片震颤的方法

A Method for Resolving the Chattering of Ultrathin Sections

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【作者】 郭新秋王戈王瑞斌

【Author】 GUO Xin-qiu;WANG Ge;WANG Rui-bin;Instrumental Analysis Center,Shanghai Jiaotong University;

【机构】 上海交通大学分析测试中心

【摘要】 超薄切片技术是生物材料中透射电子显微镜样品制备的关键环节,可以将样品制成100 nm以下的超薄切片,使得样品能够在透射电子显微镜中得到清晰图像。然而在此过程中,常常会出现刀痕、震颤、空洞、皱褶等各种各样的问题,严重影响超薄切片的质量,甚至无法观察到组织细胞的超微结构。文中就其中的一种问题——震颤,产生原因及解决方法进行探讨。

【Abstract】 Since the electron beam penetration ability in transmission electron microscopy(TEM) is weak,it is impossible to get a clear image of general cells and tissue slices in the TEM.The effective application of TEM in biology,therefore,has been difficult.Ultrathin sectioning technique is a key step in preparation of TEM samples for biological materials.But in this process,there appear a variety of problems such as knife mark,chattering,empty,and fold,which seriously affect the quality of the ultrathin-sections,making it difficult to observe the ultra-structure of tissues and cells.In this paper,one of the problems—chattering was discussed and a method for resolving the chattering was discussed.

  • 【文献出处】 实验室研究与探索 ,Research and Exploration in Laboratory , 编辑部邮箱 ,2013年10期
  • 【分类号】R361.2
  • 【被引频次】6
  • 【下载频次】239
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