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高温时效过程中SnAgCu钎焊接头显微组织的演化规律

Microstructure Evolution of SnAgCu Solder Joint During High Temperature Aging

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【作者】 田君戴品强郝虎

【Author】 TIAN Jun1,DAI Pinqiang1,HAO Hu2(1.Department of Material Science and Engineering,Fujian University of Technology,Fuzhou 350108,China;2.College of Mechanical Engineering and Applied Electronics Technology,Beijing University of Technology,Beijing 100124,China)

【机构】 福建工程学院材料科学与工程系北京工业大学机械工程与应用电子技术学院

【摘要】 研究了215℃时效过程中Sn3.8Ag0.7Cu无铅钎料焊点内部及与Cu基板界面处显微组织的演化规律。结果表明:试样在时效过程中的放置方式对显微组织的变化会产生重要影响。当钎料焊点处于Cu基板的上方时,215℃时效后显微组织的变化与以往170℃时效后显微组织的变化相似,即界面处金属间化合物层的厚度会随着时效时间的延长而逐渐增加。然而,当钎料焊点处于Cu基板的下方时,215℃时效后钎料焊点内部及界面处的显微组织发生了显著的变化,伴随着Cu基板的溶解在钎料焊点表面形成了大量的体积较大的金属间化合物Cu6Sn5。

【Abstract】 The evolution of microstructure and the intermetallic compounds for lead-free Sn3.8Ag0.7Cu solder during 220℃ aging was investigated.The results indicate that the placement way of the sample in the furnace plays an important role in the microstructure evolution during 220℃ aging.When the sample is placed in the furnace with the solder cap on the top of the Cu substrate,the similar microstructure evolution is observed after 220℃ aging compared with 170℃ aging,that is the thickness of the intermetallic compound layer(IML) increases with the increase of aging time.However,when the sample is placed in the furnace upside down,great changes in microstructure evolution appear both inside the solder cap and at the inerface between the solder and Cu substrate,a great number of large-sized Cu6Sn5IMCs form at the bottom of the solder cap which is accompanied by the dissolution of Cu substrate.

【基金】 福建省教育厅资助项目(JB08191);福建工程学院院基金项目(GY-Z0744)
  • 【文献出处】 热加工工艺 ,Hot Working Technology , 编辑部邮箱 ,2013年09期
  • 【分类号】TG454
  • 【被引频次】2
  • 【下载频次】109
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