节点文献
Simulation of photoelectric X-ray polarimetry and reconstruction of the photoelectron azimuthal angle
【摘要】 Sensitive X-ray polarimetry in the keV energy range can be achieved by measuring the azimuthal angle distribution of emitted electrons after the photoelectric absorption of X-rays in a micropattern gas detector. However, the initial direction of the electron is not readily measurable due to the randomization of its motion during energy loss. By using the Geant4, Maxwell and Garfield packages, we simulated the detected electron tracks following photoelectric absorption, electron drift and diffusion in the gas, and proposed a technique capable of reconstructing the initial direction of the emitted photoelectron. The technique allows us to measure the angular modulation of flux predicted for a polarized X-ray beam. We calculated the modulation factors in 2-10 keV with a gas mixture of neon and CO2 , and discussed how electron diffusion along the drift will dilute the track and suppress the modulation. These results are useful for the design of the X-ray polarimeter.
【Abstract】 Sensitive X-ray polarimetry in the keV energy range can be achieved by measuring the azimuthal angle distribution of emitted electrons after the photoelectric absorption of X-rays in a micropattern gas detector. However, the initial direction of the electron is not readily measurable due to the randomization of its motion during energy loss. By using the Geant4, Maxwell and Garfield packages, we simulated the detected electron tracks following photoelectric absorption, electron drift and diffusion in the gas, and proposed a technique capable of reconstructing the initial direction of the emitted photoelectron. The technique allows us to measure the angular modulation of flux predicted for a polarized X-ray beam. We calculated the modulation factors in 2–10 keV with a gas mixture of neon and CO2 , and discussed how electron diffusion along the drift will dilute the track and suppress the modulation. These results are useful for the design of the X-ray polarimeter.
【Key words】 X-ray; polarimetry; micropattern gas detector;
- 【文献出处】 Chinese Physics C ,中国物理C , 编辑部邮箱 ,2013年03期
- 【分类号】O434.1
- 【被引频次】1
- 【下载频次】30