Multifrequency test can maximize differences between the failure state and the normal state of the analog circuit's response,and Neural Networks(NNs)have the ability to solve complex classification problems.An efficient approach for diagnosing faults in analog circuits is presented.It is based on the advantages of both multifrequency test and NNs.The sensitivity analysis is used to generate and choose the multifrequency test vectors of the Circuit Under Tes(tCUT).Fault features of the test point in CUT are ...