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AlGaN metal-semiconductor-metal ultraviolet photodetectors on sapphire substrate with a low-temperature AlN buffer layer

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【作者】 张军琴杨银堂贾护军

【Author】 Junqin Zhang;Yintang Yang;Hujun Jia;Ministry of Education, Key Laboratory of Wide Band Gap Semiconductor Materials and Devices,Xidian University;

【机构】 Ministry of Education, Key Laboratory of Wide Band Gap Semiconductor Materials and Devices,Xidian University

【摘要】 Unintentionally doped AlGaN thin films are grown on c-plane(0001)sapphire substrate by metal-organic chemical vapor deposition,and low-temperature AlN is deposited onto sapphire substrate used as a bu?er layer.AlGaN metal-semiconductor-metal ultraviolet photodetectors with Ni/Au interdigitated contact electrodes are then fabricated by lift-off technology.The dark current of the AlGaN photodetectors is5.61×10-9A at 2-V applied bias and the peak response occurrs at 294 nm.

【Abstract】 Unintentionally doped AlGaN thin films are grown on c-plane(0001) sapphire substrate by metal-organic chemical vapor deposition, and low-temperature AlN is deposited onto sapphire substrate used as a bu?er layer. AlGaN metal-semiconductor-metal ultraviolet photodetectors with Ni/Au interdigitated contact electrodes are then fabricated by lift-off technology. The dark current of the AlGaN photodetectors is 5.61×10-9 A at 2-V applied bias and the peak response occurrs at 294 nm.

【基金】 supported by the National Natural Science Foundation of China(No.61006052);the Fundamental Research Funds for the Central Universities(No.K5051325009)
  • 【文献出处】 Chinese Optics Letters ,中国光学快报(英文版) , 编辑部邮箱 ,2013年10期
  • 【分类号】TN23
  • 【被引频次】2
  • 【下载频次】33
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