节点文献
基于专用芯片的微波电路模块嵌入式测试设计验证
The embedded design verification test of microwave circuit modules based on specific chips
【摘要】 本文提出一种基于专用芯片的微波电路模块嵌入式测试设计方法,来解决微波电路测试难以接入、故障诊断困难的技术难题,文中阐述了微波电路模块嵌入式测试设计的思路及其硬件设计与软件设计方法,并针对基于专用芯片的微波电路模块嵌入式测试设计进行了验证。
【Abstract】 In the Paper,the author introduces an embedded design verification test based on specific chips to solve the technical problems of microwave circuit test and fault diagnosis.The author explains embedded design of microwave circuit modules and approach of hardware design and software design,and finally verifies the embedded design of microwave circuit modules based on specific chips.
【关键词】 专用芯片;
微波电路模块;
嵌入式测试;
BIT;
故障注入;
【Key words】 Specific Chips; Microwave Circuit Modules; Embedded Test; BTT; Fault Injection;
【Key words】 Specific Chips; Microwave Circuit Modules; Embedded Test; BTT; Fault Injection;
- 【文献出处】 电子世界 ,Electronics World , 编辑部邮箱 ,2013年07期
- 【分类号】TN492
- 【下载频次】64