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基于FPGA IP核的扫描式激光测径方法

A Laser-scanned Diameter Measurement Method Based on FPGA IP Core

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【作者】 朱庆叶赵光兴

【Author】 ZHU Qingye;ZHAO Guangxing;Department of Electrical and Information Engineering,Anhui University of Technology;

【机构】 安徽工业大学电气信息学院

【摘要】 快速、精确地测量对激光测径技术具有重要意义,考虑到传统单片机检测速度慢、时耗开发大等问题,文中提出了一种基于FPGA IP核技术的扫描式激光测径系统的设计方案及实现方法。同时在Quartus II集成环境中进行了系统的综合、布局布线及时序仿真。仿真结果验证构建有IP核的激光测径系统,运算速度快,测量数据精确、且便于升级。

【Abstract】 The rapid and accurate measurement plays an important role in laser-scanned measuring for diameter.Considering the fact that the traditional MCU system has such problems like low speed and large cost,a new method based on the technology of FPGA IP core is proposed for laser-scanned measuring for diameter.Meanwhile,with the IDE of Quartus II,the design is synthesized,placed and routed.The timing simulation shows that the designed measurement method for diameter system using IP core works well with higher speed,better accuracy and easier upgrading.

【关键词】 FPGA扫描激光测径MCU软核
【Key words】 FPGAscanninglaser-diameter measurementMCU soft core
  • 【文献出处】 电子科技 ,Electronic Science and Technology , 编辑部邮箱 ,2013年10期
  • 【分类号】TN247;TM205
  • 【下载频次】73
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