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基于双闪存的大容量冲击波超压测试系统

The shock wave overpressure test system based on double flash memory

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【作者】 张海龙马铁华谢锐刘双红

【Author】 Zhang Hailong;Ma Tiehua;Xie Rui;Liu Shuanghong;Key Laboratory of Instrumentation Science&Dynamic Measurement,North University of China;Key Laboratory of Electronic Measurement Technology,North University of China;

【机构】 中北大学仪器科学与动态测试教育部重点实验室中北大学电子测试技术国家重点实验室

【摘要】 为了解决冲击波超压测试系统的存储容量小、功耗大的问题,设计了一种基于AVR单片机和CPLD的双闪存冲击波超压测试系统。阐述了存储测试方法,设计了负延时模块,通过CPLD对被测量进行高速采集,使用单片机控制两片闪存交替工作的模式来记录被测信号。根据被测信号的频谱选择了传感器,针对该传感器设计了模拟信号调理电路和数字电路。实验证明将系统应用于爆炸现场可完成对冲击波压力信号的检测和存储。

【Abstract】 A double flash memory test system of shock wave overpressure based on AVR MCU and CPLD is designed to solve the problems of small storage capacity,high power consumption in the traditional shock wave test.In this paper,storage test method and negative delay module are described in detail.CPLD is used to produce high- speed sample signal and MCU is used to control two flashes record the tested signal alternately.The sensor was chosen according to frequency spectrum of measured signal.The analog signal conditioning circuit and digital circuit were designed on the basis of sensor type.Experiments show the system applied in explosion field can complete the detection and storage of shockwave pressure signal.

【关键词】 冲击波超压测试测试系统校准
【Key words】 shock waveoverpressure testmeasurement systemcalibration
  • 【文献出处】 电子技术应用 ,Application of Electronic Technique , 编辑部邮箱 ,2013年11期
  • 【分类号】TP274
  • 【被引频次】6
  • 【下载频次】86
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