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Optical micro-scanning location calibration of thermal microscope imaging system

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【Author】 GUAN Cong-rong1,2, GAO Mei-jing3, JIN Wei-qi1, WANG Ji-hui1 (1.MoE Key Laboratory of Photoelectronic Imaging Technology and System, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China; 2.College of Mechanical and Electrical Engineering, North China University of Technology, Beijing 100041, China; 3.Department of Information Science and Engineering, Yanshan University, Qinhuangdao, Hebei 066004, China)

【机构】 MoE Key Laboratory of Photoelectronic Imaging Technology and System, School of Optoelectronics, Beijing Institute of Technology； College of Mechanical and Electrical Engineering, North China University of Technology； Department of Information Science and Engineering, Yanshan University；

【摘要】 A method of micro-scanning location adaptive calibration was proposed, which was realized by the digital image micro-displacement estimation. With geometric calculation, this calibration method used the displacement estimation of two thermal microscope images to get the size and direction of each scanning location calibration angle. And each location calibration process was repeated according to the offset given by the system beforehand. The comparison experiments of sequence oversampling reconstruction before and after the micro-scanning location calibration were done. The results showed that the calibration method effectively improved the thermal microscope imaging quality.更多还原

【Abstract】 A method of micro-scanning location adaptive calibration was proposed, which was realized by the digital image micro-displacement estimation. With geometric calculation, this calibration method used the displacement estimation of two thermal microscope images to get the size and direction of each scanning location calibration angle. And each location calibration process was repeated according to the offset given by the system beforehand. The comparison experiments of sequence oversampling reconstruction before and after the micro-scanning location calibration were done. The results showed that the calibration method effectively improved the thermal microscope imaging quality.更多还原

【关键词】 thermal microscope imaging； micro-scanning； location calibration； oversampling reconstruction；
【Key words】 thermal microscope imaging； micro-scanning； location calibration； oversampling reconstruction；

【基金】 Supported by Beijing Natural Science Foundation(4062029);Ministry of Science and Technology Innovation Foundation for Small and Medium-sized Enterprises (06KW1051);North China University of Technology Dr. Start-up Fund for 2013

【文献出处】 Journal of Beijing Institute of Technology ,北京理工大学学报(英文版) , 编辑部邮箱 ,2013年02期

【分类号】TH742
【下载频次】62

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