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抗黄矮病小麦新品系的分子标记检测研究
Detection of wheat lines with resistance to Yellow dwarf virus by molecular markers
【摘要】 本研究对以小麦-中间偃麦草异附加系L1和小麦-中间偃麦草部分双二倍体‘无芒中4’为抗源选育出的抗黄矮病小麦新品系进行分子检测和抗病性鉴定。通过应用RAPD、SSR、SCAR 3种分子标记OPF15、Xgwm37、SC-W37进行分子检测,并采用人工接种和大田自然感病的方式进行抗黄矮病鉴定,筛选到了‘93646’、‘2003-2’等高抗黄矮病的小麦新品系。分子检测抗黄矮病基因与田间抗病鉴定结果基本一致,应用的3种PCR标记都可以检测出抗病材料,但SCAR标记SC-W37特异性强、稳定性好,可在小麦抗黄矮病育种早代选择过程中发挥重要作用。
【Abstract】 Some BYDV translocation lines were studied by using wheat-Thinopyrum intermedium the addition line L1 and a partial amphiploid ’Zhong 4 awnless’ as the resistance parents.This translocation lines were used to screen molecular markers and identification of disease resistance.A RAPD marker OPF15,SSR marker Xgwm37 and SCAR marker SC-W37 were developed for the BYDV resistance.Some new strains with excellent BYDV resistance were selected by identification of disease resistance and molecular marker,including ’2003-2’ and ’93646’.The results showed that the BYDV resistant materials could be detected by PCR markers.The SCAR marker SC-W37 had high specificity and good reliability,which might play an important role in early-generation selection in wheat breeding.
【Key words】 Barley yellow dwarf virus(BYDV); molecular marker; detection; identification of disease resistance;
- 【文献出处】 植物保护 ,Plant Protection , 编辑部邮箱 ,2012年03期
- 【分类号】S512.1
- 【被引频次】3
- 【下载频次】139