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等离子体源辅助磁控溅射法低温(200℃)制备多晶硅薄膜

Polysilicon films grow at low temperature(200℃)by plasma assisted magnetron sputtering

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【作者】 朱明苏元军范鹏辉徐军

【Author】 ZHU Ming1,2,SU Yuan-jun1,2,FAN Peng-hui2,XU Jun1(1.Laboratory of Materials Modification by Laser,Ion and Electron Beams(Dalian University of Technology), Ministry of Education,Dalian 116024,China;2.Nissin Electric-Dalian University of Technology Joint R&D Center,Dalian University of Technology,Dalian 116024,China)

【机构】 三束材料表面改性教育部重点实验室大连理工大学日新电机-大连理工大学联合研发中心

【摘要】 利用电感耦合等离子体辅助中频直流脉冲磁控溅射技术在200℃成功制备出多晶硅薄膜。详细介绍了等离子体源辅助磁控溅射技术制备多晶硅的工艺过程,并对辅助等离子体源放电功率对硅薄膜结晶度的影响进行了研究。利用拉曼散射、X射线衍射、傅里叶红外光谱对所制备的硅薄膜进行了表征。

【Abstract】 Polycrystalline silicon thin film was prepared by inductively coupled plama assisted intermediate frequency dc pulsed magnetron sputtering at 200℃.The preparation process of polycrystalline silicon by plasma assisted magnetron sputtering technique was described in detail and the effects of discharge power of the plasma source on the crystalinity of deposited silicon film was studied.Various characterization techniques such as Raman scattering,X-ray diffraction(XRD),Fourier transform infrared spectroscopy(FT-IR) were employed to characterize the deposited films.

  • 【分类号】O484.1
  • 【被引频次】3
  • 【下载频次】159
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