弯曲损耗不敏感单模光纤1310nm处模场直径测试方法比对分析

【摘要】 本文通过实验的方法分析研究了不同高阶模滤除条件对ITU-T G.657.A2、A3和ITU-T G.657.B3类光纤模场直径测量结果的影响。实验表明,采用22m试样光纤的测试条件或采用将2m标准的G.652光纤熔接在2mG.657试样光纤上,并在标准的G.652光纤上绕两个40mm半径圈的测试条件均可以准确测试G.657.A类包括A3类和G.657.B类光纤在1310nm处的模场直径。采用其他不同的弯曲半径或通过绕更多圈的滤除高阶模的方法并不总能够有效滤除G.657.A类包括A3类和G.657.B类2m试样光纤中的高阶模。特别是弯曲性能好且λc≥1310nm的G.657光纤,1310nm处模场直径测试的结果会受高阶模影响,并导致实测值比正确值偏小。为了避免高阶模的影响,推荐采用22m试样光纤测试条件或采用将2mG.652光纤熔接在2mG.657试样光纤上,并在G.652光纤上绕两个40mm半径圈的测试条件测试G.657光纤1310nm处模场直径。更多还原

【Abstract】 The mode field diameter(MFD) of ITU-T G.657.A2,A3 and ITU-T G.657.153 fibers were measured under different methods to remove higher order mode to understand the higher order mode’s influence on the measured MFD results at 131()nm.The test results show that increasing the G.657 sample fiber length to 22 meters or splicing two meters of ITU-T G.652 complaint standard single-mode lead fiber to 2 meters G.657 sample fiber and applying two 80 mm turns on the lead fiber can both obtain accurate measurements for G.657. A including A3 or G.657.B fiber MFD at 1310nm.The measured MFD at 13l0nm will he lower than the actual MFD since other higher order mode removal methods been used by introducing more than one loops with smaller radius on the 2 meters G.657 fiber sample is not always a sufficient higher order mode filter,especially to the good bending-loss insensitive G.657.A including A3 or G.657.B fiber withλc≥1310nm.To avoid the higher order mode influence,a 22 meters G.657 fiber sample or splicing 2 meters of ITU-T G.652 complaint standard single-mode lead fiber to a 2 meter G.657 sample fiber and applying two 80 mm turns on the lead fiber are recommended to measure G.657 fiber MFD at 1310nm.更多还原