【摘要】 建立了用电感耦合等离子体发射光谱(ICP-OES)法测定食品添加剂SiO2中Cr、Co、Ni、As、Cd、Sb、Hg、Pb等有害元素的分析方法。样品用硝酸+氢氟酸分解后,试液直接用ICP-OES法同时测定上述8种元素。研究了基体硅对分析元素的光谱干扰情况和基体效应的影响,确定了仪器的最佳工作参数,通过选择灵敏度高且不受干扰的待测元素谱线为分析线。结果表明:8种待测元素的检出限在1.69~8.33μg/L之间,各待测元素的浓度与信号强度的线性关系良好,线性相关系数R2≥0.999 8,各待测元素的精密度良好,RSD<2.95%,三水平加标回收率为93.3%~102.3%。更多还原

【Abstract】 To establish the method for determination of Cr,Co,Ni,As,Cd,Sb,Hg and Pb harmful elements in food additives SiO2 by inductively coupled plasma optical emission spectrometry(ICP-OES).Samples were decomposed by HNO3 and HF followed by dilution with ultrapure water then the above 8 elements in the solution was analyzed directly by ICP-OES.The effect of matrix Si on the determination was studied.Working parameters of the instrument were optimized and suitable analytical lines were selected.The method was shown to be very sensitive with limits of quantification in the range of(1.69~8.33) μg/L for all investigated elements,linear correlation R2≥0.999 8,the average recovery of the samples was in the range of 93.34%~102.3% at spiked three levels and the relative standard deviation(RSD) less than 2.95%.更多还原