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不同电极对外延BiFeO3薄膜铁电性能的影响

Influence of Different Electrode on the Property of Epitaxial BiFeO3 Thin Film

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【作者】 马继奎赵庆勋彭增伟陈明敬史金超刘保亭

【Author】 MA Ji-kui1,ZHAO Qing-xun2,PENG Zeng-wei2,CHEN Ming-jing2,SHI Jin-chao1,LIU Bao-ting2(1.YingLi Green Energy Holding Co.,Ltd,Baoding 071051,China; 2.College of Physics Science and Technology,Hebei University,Baoding 071002,China)

【机构】 英利绿色能源控股有限公司河北大学物理科学与技术学院

【摘要】 采用磁控溅射的方法在SrRuO3/SrTiO3(001)衬底上外延生长BiFeO3薄膜,研究以不同金属或氧化物做顶电极时的铁电、铁磁性质和漏电流及其导电机制。X射线衍射图谱和Φ扫描图结果显示BiFeO3薄膜沿c轴外延生长,以Pt、Al做顶电极的薄膜剩余极化强度2Pr为68μC/cm2,生长Pt/SRO、FePt顶电极的薄膜剩余极化强度较小,2Pr为44μC/cm2,矫顽场2Ec约为370±20 kV/cm。薄膜的漏电流密度较小而且趋于饱和,在U=12 V时最大为1.94×10-3A/cm2,体传导普尔弗兰克导电为BiFeO3薄膜主要的导电机制。BFO薄膜展现出弱磁性,饱和磁化强度为9.3 emu/cm3,矫顽场为338 Oe。

【Abstract】 Epitaxial BiFeO3(BFO) thin film have been grown on SrRuO3/SrTiO3(001) substrates by radio frequency magnetron sputtering.Ferroelectric,ferromagnetic,leakage current and its mechanisms were investigates with different metal and conductive oxide top electrode.X-ray diffraction measurement and Φ scan spectra indicates the formation of an epitaxial single-phase.BFO film is well crystallized.The remnant polarization(2Pr) of BFO film by Pt and Al top electrode are 68 μC/cm2.They are 44 μC/cm2 by Pt /SRO and FePt top electrode at a coercive field(2Ec) of 370±20 kV/cm.The film has low leakage current density with largest of 1.94×10-3 A/cm2 at 12 V and Poole-Frenkle emission is the main conduction mechanism in BFO film.Moreover,BFO thin film exhibits a weak ferromagnetic behavior with a saturation magnetization of 9.3 emu/cm3 and a coercive field of 338 Oe.

【关键词】 BiFeO3磁控溅射铁电性外延生长
【Key words】 BiFeO3magnetron sputteringferroelectricepitaxial growth
【基金】 国家自然科学基金(60876055,11074063);高等学校博士点基金(20091301110002);河北省自然科学基金(E2009000207,E2008000620,08B010)
  • 【文献出处】 人工晶体学报 ,Journal of Synthetic Crystals , 编辑部邮箱 ,2012年06期
  • 【分类号】O484.1
  • 【被引频次】5
  • 【下载频次】181
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