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以Ni-Al为底电极的P(VDF-TrFE)铁电电容器的结构与性能

Microstructure and Properties of P(VDF-TrFE) ferroelectric capacitor Using Ni-Al as the bottom electrode

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【作者】 闫会芳赵庆勋付跃举刘卓佳张婷郭建新任国强刘保亭

【Author】 YAN Hui-fang,ZHAO Qing-Xun,FU Yue-ju,LIU Zhuo-jia,ZHANG Ting,GUO Jian-xin,Ren Guo-qiang,LIU Bao-ting(College of Physics Scinence and Technology,Heibei University,Baoding 071002,China)

【机构】 河北大学物理科学与技术学院

【摘要】 应用磁控溅射法制备Ni-Al和Pt薄膜,溶胶-凝胶法制备P(VDF-TrFE)铁电共聚物薄膜,在SiO2/Si(001)衬底上首次构架了Pt/P(VDF-TrFE)/Ni-Al异质结电容器。X射线衍射(XRD)结果表明:Ni-Al薄膜为非晶结构,P(VDF-TrFE)薄膜具有较好的结晶质量。研究发现,在20 Hz测试频率下,Pt/P(VDF-TrFE)/Ni-Al电容器具有饱和的电滞回线,在90 V驱动电压下,剩余极化强度与矫顽场分别为7.6μC/cm2和45.7 V。在外加电压为40 V时,薄膜的漏电流密度约为5.37×10-6 A/cm2。漏电机制研究表明,Pt/P(VDF-TrFE)/Ni-Al电容器满足欧姆导电机制。铁电电容器经过109极化反转后没有发现明显的疲劳现象。

【Abstract】 Pt/P(VDF-TrFE)/Ni-Al heterostructure capacitors have been fabricated first on SiO2/Si(001) substrate,in which P(VDF-TrFE) copolymer ferroelectric film was prepared by sol-gel method and Ni-Al and Pt films were prepared by magnetron sputtering.X-ray analysis indicated that Ni-Al film is amorphous,while P(VDF-TrFE) film is crystallined.It is found that Pt/P(VDF-TrFE)/Ni-Al capacitor possesses well saturated loops,the remnant polarization and coercive voltage are7.6 μC/cm2 and 45.7 V,respectigatively,at applied voltage of 90 V and 20 Hz.The leakage current density of the capacitor,measured at 40 V,is ~5.37×10-6A/cm2.Further analyses indicated that the Pt/P(VDF-TrFE)/Ni-Al ferroelectric capacitors satisfies the ohmic conduction behavior.Moreover,No obvious fatigue can be found the capacitors up to 109 swithching cycles.

【基金】 国家自然科学基金(60876055、11074063);河北省自然科学基金项目(E2009000207,E2011201092);河北省应用基础研究计划重点项目(10963525D);高等学校博士点基金(20091301110002)
  • 【文献出处】 功能材料与器件学报 ,Journal of Functional Materials and Devices , 编辑部邮箱 ,2012年01期
  • 【分类号】TM53
  • 【被引频次】1
  • 【下载频次】136
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