【摘要】 采用辉光放电质谱法(GD-MS)对高纯铌中Ta,Mo,W等痕量杂质元素进行了测试,并对GD-MS工作参数进行了优化,部分元素与采用电感耦合等离子体质谱法(ICP-MS)定量分析的结果进行比较,对某些元素含量差别较大的原因进行了分析,论述了Element GD辉光放电质谱仪的特点及其在痕量杂质分析上的优势。更多还原

【Abstract】 Elements such as Ta,Mo,W in high-purity niobium were determined by glow discharge mass spectrometry(GD-MS).The operating parameters and conditions of GD-MS were optimized and selected.Results of a partion of elements determined by GD-MS were compared with those analyzed by inductive coupled plasma mass spectrometry(ICP-MS).The characteristics and advantages of trace element analysis by element GD-MS were discussed.更多还原