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退火气氛对SnO2:F薄膜low-e性能的影响(英文)

Effects of Post Annealing Atmosphere on Low-emission of SnO2:F Thin Films

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【作者】 高倩李铭刘涌宋晨路葛言凯韩高荣

【Author】 Gao Qian;Li Ming;Liu Yong;Song Chenlu;Ge Yankai;Han Gaorong;State key Laboratory of silicon Materials,Zhejiang University;Weihai Blue Star Glass Co,Ltd.;

【机构】 浙江大学 硅材料国家重点实验室威海蓝星玻璃股份有限公司

【摘要】 SiO2:F薄膜作为low-e玻璃的功能层材料,广泛应用于节能镀膜玻璃。对帮化学气相沉积法在玻璃表面沉积的约250 nm厚的SiO2:F薄膜进行不同气氛的退火处理。结果发现,薄膜的电学、光学性能在氦气和空气两种不同的退火气氛下会有显著的变化。SiO2:F薄膜的Low-e性能经过空气中高温退火下降明显。但在空气中退火后,再在氮气保护下退火,性能会有所恢复。对该现象的机理也进行了研究。

【Abstract】 The SnO2:F thin films with low-emission property have been widely used as a dominating kind of energy saving glass.Different annealing approaches were carried out on the as-deposited SnO2:F(250 nm,with 20 nm SiO2 barrier on glass substrate) thin films.It is found that the electrical and optical characteristics are significantly influenced by annealing atmosphere.The low-emission property of SnO2:F decreases sharply after post annealing in air,while partly recovers after annealing in air followed by annealing in nitrogen.In addition,the mechanism has also been successfully uncovered.

【关键词】 Low-eSnO2:F薄膜退火常压化学气相沉积
【Key words】 low-emissivitySnO2:F thin filmannealingAPCVD
【基金】 NSFC(50824001)
  • 【文献出处】 稀有金属材料与工程 ,Rare Metal Materials and Engineering , 编辑部邮箱 ,2012年S3期
  • 【分类号】TB383.2;TG156.2
  • 【下载频次】41
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