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退火气氛对SnO2:F薄膜low-e性能的影响(英文)
Effects of Post Annealing Atmosphere on Low-emission of SnO2:F Thin Films
【摘要】 SiO2:F薄膜作为low-e玻璃的功能层材料,广泛应用于节能镀膜玻璃。对帮化学气相沉积法在玻璃表面沉积的约250 nm厚的SiO2:F薄膜进行不同气氛的退火处理。结果发现,薄膜的电学、光学性能在氦气和空气两种不同的退火气氛下会有显著的变化。SiO2:F薄膜的Low-e性能经过空气中高温退火下降明显。但在空气中退火后,再在氮气保护下退火,性能会有所恢复。对该现象的机理也进行了研究。
【Abstract】 The SnO2:F thin films with low-emission property have been widely used as a dominating kind of energy saving glass.Different annealing approaches were carried out on the as-deposited SnO2:F(250 nm,with 20 nm SiO2 barrier on glass substrate) thin films.It is found that the electrical and optical characteristics are significantly influenced by annealing atmosphere.The low-emission property of SnO2:F decreases sharply after post annealing in air,while partly recovers after annealing in air followed by annealing in nitrogen.In addition,the mechanism has also been successfully uncovered.
【Key words】 low-emissivity; SnO2:F thin film; annealing; APCVD;
- 【文献出处】 稀有金属材料与工程 ,Rare Metal Materials and Engineering , 编辑部邮箱 ,2012年S3期
- 【分类号】TB383.2;TG156.2
- 【下载频次】41