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不同厚度Tl-2212薄膜的表面形貌及超导特性研究
Study on the Surface Morphology and Superconducting Properties of Tl-2212 Films with Different Thicknesses
【摘要】 采用直流磁控溅射法和后退火技术在蓝宝石基片上制备了Tl-2212超导薄膜,考察了Tl-2212薄膜的厚度对其形貌和超导特性的影响。实验结果表明,随着超导薄膜厚度增加,其表面形貌由致密平整的结构演化为片状晶体结构,临界转变温度Tc和临界电流密度Jc先增大后减小,微波表面电阻Rs先减小后增大。在退火的CeO2缓冲层上所制备的无裂纹薄膜的最大厚度达到600nm,并仍然具有良好的超导性能。
【Abstract】 Tl-2212 high temperature superconducting(HTS) films were prepared on r-cut sapphire substrates buffered with CeO2 by dc magnetron sputtering technique and post-annealing process.The effects of various thicknesses of Tl-2212 films on their surface morphologies and superconducting properties were investigated.The results show that with increasing of the superconducting film thickness,the dense surface morphology evolves into flake-like crystal structure,the critical temperature Tc and critical current density Jc increase and then decrease,and the microwave surface resistance Rs decreases and then increases.The maximum thickness limitation of the crack-free Tl-2212 films,with CeO2 buffer layers annealed,reaches to 600 nm.The films possess excellent superconducting properties.
【Key words】 Tl-2212 superconducting thin film; r-cut sapphire; surface morphology; superconducting property;
- 【文献出处】 稀有金属材料与工程 ,Rare Metal Materials and Engineering , 编辑部邮箱 ,2012年03期
- 【分类号】O484.1
- 【被引频次】3
- 【下载频次】134