【摘要】 机内测试(Built-in Test,BIT)技术是改善系统或设备测试性和维修性的重要途径,通过在机载计算机中设计专门的BIT电路,配合专门的BIT软件,以达到大幅度提高机载计算机的可靠性和安全性的目的。但是较高的虚警率一直是阻碍BIT技术在机载计算机中广泛应用的一个重要原因。文章在对机载计算机BIT虚警机理模式进行分析的基础上,提出一种新型的机载计算机BIT虚警问题的分析方法,并给出BIT设计策略及关键技术解决方案。经过实例分析证明该策略明显降低了虚警率,提高了机载计算机的可靠性及可维护性。更多还原

【Abstract】 Aim.The introduction of the full paper reviews a number of papers in the open literature,and they show that the high false alarm rate is the important reason why BIT technology cannot be widely applied.The core of Section 1 consists of:(1) we make a careful analysis of false alarm problem in regular BIT(built-in test) technology,the analysis shows that 50% of the inherent false alarms exist in regular BIT technology.(2) we apply the Bayesian theory to the analysis of false alarm rate and establish the Bayesian model of the false alarm problem.(3) we prove that the transient fault is an important reason for the high false alarm rate and low fault detection rate,and that eliminating the influence of the transient fault can improve the fault detection rate and reduce the false alarm rate.Based on these conclusions,we suggest a new BIT algorithm.In Section 2,we put forward a BIT design of a serial port channel which is the core-part of the airborne computer.The test results of the design are given in Table one,and they show that the algorithm reduces the false alarm rate by about 40% and significantly increases the reliability and maintainability of the airborne computer.更多还原