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复合缺陷型电磁帯隙谐振腔

Composite defect electromagnetic band gap cavity

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【作者】 柏宁丰洪玮孙小菡

【Author】 Bai Ning-Feng Hong Wei Sun Xiao-Han (Research Center for Electronic Device & System Reliability,Southeast University Nanjing 210096,China)

【机构】 东南大学电子器件与系统可靠性研究中心

【摘要】 提出了一种复合缺陷型电磁带隙(EBG)谐振腔,通过对该EBG结构的带隙分析,指出该谐振腔可在大尺寸下实现单模工作,提供更大的容差空间,且具有高Q值.数值模拟结果表明,基于复合缺陷EBG结构构成的谐振腔,单模工作条件可以放宽到外圈金属柱直径与周期之比为0.6,内圈金属柱直径与周期比为0.9;而传统中心缺陷型EBG结构的小于0.3.

【Abstract】 We demonstrate an approach to create a high Q factor two-dimensional (2D) electromagnetic band gap ( EBG) structure with composite defects in the center of the structures. By theoretical calculation,we show that a single-mode 2D EBG structure can be created with different ratios of diameter,d,to the lattice period,Λ,in this structure. This structure can achieve high Q factor and single mode operation with large d/Λ of the defect at the first circle around the removed rod in the center. With our structure,the single mode operation can be achieved within d/Λ < 0. 9 at the defect rods and d/Λ < 0. 6 at the others. In comparison,the condition of d/Λ < 0. 3 should be strictly satisfied for the traditional design. These results provide very important guidelines for designing of the 2D EBG structure which can be used in traveling-wave tube device.

【关键词】 电磁带隙复合缺陷谐振腔单模
【Key words】 electromagnetic band gapcomposite defectcavitysingle mode
  • 【文献出处】 物理学报 ,Acta Physica Sinica , 编辑部邮箱 ,2011年01期
  • 【分类号】O483
  • 【被引频次】1
  • 【下载频次】112
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