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真空变温薄膜电阻测试仪器的设计与应用
New instrument for measuring thin film resistance with varying temperature in vacuum
【摘要】 设计了自制真空变温薄膜电阻测试仪器,可以实现粗真空条件下,从室温到300℃的四探针法薄膜电阻测试.该仪器适用于开展薄膜物性与电阻和温度相关的实验,例如,金属与半导体薄膜的温度-电阻特性实验,二氧化钒薄膜热滞效应实验等.
【Abstract】 New self-made instrument for measuring thin film resistance using four-probe method with varying temperature(from room temperature to 300 ℃) under rough vacuum was introduced.It was suitable for the development of physics experiments on properties related to the temperature-dependent resistance,for example,the resistance v.s.temperature characteristic of metal and semiconductor thin film and thermal-lag effect of vanadium dioxide thin film,and so on.
- 【文献出处】 物理实验 ,Physics Experimentation , 编辑部邮箱 ,2011年01期
- 【分类号】O484.42
- 【被引频次】3
- 【下载频次】161