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CdTe组件集成结构模拟优化及前、背电极接触电阻测定

INTEGRATIION STYDY OF CdTe THIN FILMS PV MODULE

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【作者】 汪灵冯良桓张静全蔡亚平武莉莉李卫黎兵雷智郑家贵曾广根蔡伟

【Author】 Wang Ling,Feng Lianghuan,Zhang Jingquan,Cai Yaping,Wu Lili,Li Wei,Li Bing, Lei Zhi,Zheng Jiagui,Zeng Guanggen,Cai Wei(College of Materials Science and Engineering,Sichuan University,Chengdu 610064,China)

【机构】 四川大学材料科学与工程学院

【摘要】 设计特定的测试结构,测量CdTe太阳电池组件的相邻单元电池的前电极与背电极的接触电阻,研究接触电阻与激光刻蚀刻痕的关系;使用module design simulator软件模拟分析相关膜层电子学性质、集成结构、单元电池性能对电池组件性能的影响。对CdTe电池组件接触电阻测量结果表明:随Ni层厚度增加,接触电阻减小,镍电极镀层较厚(410nm)时,接触电阻在10-3Ω.cm2数量级;加宽刻痕宽度使接触电阻略有下降;基频刻蚀CdTe层所得刻痕的接触电阻比倍频刻蚀高1~2个数量级。module design simulator软件模拟分析结果表明:CdTe薄膜太阳电池组件性能除与单元电池性能参数(转换效率、填充因子、短路电流、开路电压)相关外,单元电池宽度、TCO层方块电阻(或透过率)、CdTe层方块电阻、集成接触区接触电阻都对电池组件的性能存在影响。

【Abstract】 The CdTe thin films PV module had been studied by measuring the contact resistance between the back contact metal and the front TCO film of the adjacent elementary cells.The "MODULE DESIGN SIMULATOR" software had been used to simulate the effects of the film electronic performance,the integration structure,and the contact elementary cell characteristics on module characteristics.The contact resistance decreases with the increasing of the thickness of Ni film.And the contact resistance increases 1-2 orders of magnitude when the CdTe films were etched by basic frequency laser.The highest efficiency corresponds with the optimized cell width and the width of the notches.The unit cell width,sheet resistance of TCO & CdTe,and TCO/Ni contact resistance have great effect on the property of the module,respectively.With the increasing of TCO sheet resistance,the conversion efficiency firstly increase sharply and then decrease slowly.Increasing the sheet resistance of CdTe will lead to the increasing of both conversion efficiency and fill factor.

  • 【文献出处】 太阳能学报 ,Acta Energiae Solaris Sinica , 编辑部邮箱 ,2011年12期
  • 【分类号】TM914.4
  • 【下载频次】113
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