节点文献

Modeling of a Schottky Diode in CMOS Process with a Flexible “Open-Through” On-Chip De-embedding Method

Modeling of a Schottky Diode in CMOS Process with a Flexible "Open-Through" On-Chip De-embedding Method

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 孙旭光张春高立力李永明王志华

【Author】 SUN XuguangZHANG Chun**,GAO Lili,LI Yongming,WANG Zhihua Institute of Microelectronics,Tsinghua University,Beijing 100084,China

【机构】 Institute of Microelectronics,Tsinghua University

【摘要】 Modeling of Schottky diodes in the CMOS process is a key step in ultra-high frequency(UHF) radio frequency identification(RFID) transponder designs.Accurate Schottky diode models need both DC and RF models.Conventional DC models of the Schottky diode fail to predict the forward leakage current,which is crucial for precise simulation results.This paper presents a Schottky diode model with an additional diode which gives the correct forward leakage current.The RF model of the Schottky diode is constructed based on the measured S-parameters.Then,an on-chip de-embedding process is needed to remove the parasitics due to the pads and interconnection lines in the S-parameter test.A flexible "open-through" on-chip de-embedding method is proposed which only requires an "open" dummy and a "through" dummy,with all the lumped and distributed parasitics equivalent to two-port networks to give sufficient high-frequency de-embedding accuracy.By the help of this de-embedding method and the new DC model,the accuracy of the established diode model could be guaranteed.The Schottky diode model is verified by comparison between measurements and simulations and successfully applied to an RFID transponder design.

【Abstract】 Modeling of Schottky diodes in the CMOS process is a key step in ultra-high frequency(UHF) radio frequency identification(RFID) transponder designs.Accurate Schottky diode models need both DC and RF models.Conventional DC models of the Schottky diode fail to predict the forward leakage current,which is crucial for precise simulation results.This paper presents a Schottky diode model with an additional diode which gives the correct forward leakage current.The RF model of the Schottky diode is constructed based on the measured S-parameters.Then,an on-chip de-embedding process is needed to remove the parasitics due to the pads and interconnection lines in the S-parameter test.A flexible "open-through" on-chip de-embedding method is proposed which only requires an "open" dummy and a "through" dummy,with all the lumped and distributed parasitics equivalent to two-port networks to give sufficient high-frequency de-embedding accuracy.By the help of this de-embedding method and the new DC model,the accuracy of the established diode model could be guaranteed.The Schottky diode model is verified by comparison between measurements and simulations and successfully applied to an RFID transponder design.

【关键词】 Schottky diodemodelingde-embedding
【Key words】 Schottky diodemodelingde-embedding
【基金】 Supported by the National High-Tech Research and Development (863) Program of China (No. 2006AA04A109);the National Natural Science Foundation of China (No. 60806008)
  • 【文献出处】 Tsinghua Science and Technology ,清华大学学报(自然科学版)(英文版) , 编辑部邮箱 ,2011年02期
  • 【分类号】TN311.7
  • 【被引频次】1
  • 【下载频次】59
节点文献中: 

本文链接的文献网络图示:

本文的引文网络