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Preparation of a silicon micro-strip nuclear radiation detector by a two-step annealing process

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【作者】 李海霞李占奎王方聪王柱生王秀华李春艳

【Author】 LI Hai-Xia1;1) LI Zhan-Kui1 WANG Fang-Cong2 WANG Zhu-Sheng1 WANG Xiu-Hua1 LI Chun-Yan1 1 Institute of Modern Physics, Chinese Academy of Science, Lanzhou 730000, China 2 Institute of Microelectronics, School of Physical Science and Technology, Lanzhou University, Lanzhou 730000, China

【机构】 Institute of Modern Physics, Chinese Academy of ScienceInstitute of Microelectronics, School of Physical Science and Technology, Lanzhou University

【摘要】 The annealing process for boron implantation is a crucial step during large size nuclear radiation detector fabrication. It can reduce the lattice defects and the projection straggling. A two-step annealing process for boron implantation was developed instead of a one-step annealing process, and the reverse body resistance of a silicon micro-strip detector was significantly increased, which means that the performance of the detector was improved.

【Abstract】 The annealing process for boron implantation is a crucial step during large size nuclear radiation detector fabrication. It can reduce the lattice defects and the projection straggling. A two-step annealing process for boron implantation was developed instead of a one-step annealing process, and the reverse body resistance of a silicon micro-strip detector was significantly increased, which means that the performance of the detector was improved.

  • 【文献出处】 中国物理C ,Chinese Physics C , 编辑部邮箱 ,2011年07期
  • 【分类号】TL814
  • 【被引频次】2
  • 【下载频次】63
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