【摘要】 半导体量子点纳米晶体是一类典型的纳米材料,具有独特的光学特性,已在生物医学、光电转换等领域得到应用.量子点纳米晶体的标准样品对其质量控制和产业应用都有重要的意义,但需要对其光学特性和尺寸特性进行准确测量研究.我们研制了以硒化镉量子点为代表的半导体量子点纳米晶体标准样品,并对其光学特性进行定值.针对目前制约量子点粒子尺寸准确测量的透射电子显微镜样品基底问题进行改进,用碳管-氧化石墨烯微栅代替常用的超薄碳膜微栅.通过高分辨透射电子显微镜表征得到晶格清晰的小尺寸半导体量子点纳米晶体的形貌像.这些结果有助于建立硒化镉量子点半导体纳米晶体的特征带边吸收峰值与粒子粒径的准确定量对应关系,从而推动量子点的应用.更多还原

【Abstract】 Semiconductor nanocrystals(quantum dots) are a typical family of nanomaterials possessing unique optical pro-perties,and have wide applications in biomedicine and optoelectronics.Reference materials for quantum dots will be important for quality control and industry applications,but require precise measurement research on the optical and geometrical characteristics.We describe here the initial effort towards developing RMs for CdSe quantum dots by charactering the optical properties.We also modify the TEM substrate to obtain better determination of quantum dot sizes by using carbon nanotube-oxidized graphene to replace conventional carbon film.Atomic resolution images of small sized quantum dots can be obtained with HRTEM.These results could help establish more precise relation between excitonic absorption peak position with particle size,and help wider utilization of quantum dots.更多还原