【摘要】 使用脉冲激光沉积在SrTiO3衬底上生长了不同厚度的BiFeO3(BFO)薄膜,X射线衍射分析表明薄膜是BFO外延薄膜.X射线反射率测量发现BFO薄膜密度随着厚度的增加而增加,同时薄膜表面存在厚度为数纳米的非设计覆盖层.随着厚度的增加,BFO薄膜由完全应变过渡到应变部分弛豫状态,同时BFO从四方相转变为单斜相.更多还原

【Abstract】 The microstructure of epitaxial BiFeO3 (BFO) thin films with different thickness on SrTiO3 substrates were studied by the Synchrotron radiation X-ray diffraction. It was shown by X-ray reflectivity that the electron density of BFO film increases with thickness; meanwhile, a capped layer of several nm is existed on the surface of the BFO films. With the thickness increasing, we found that the BFO films are changed from fully strain tetragonal phase to partly relaxed monoclinic phase.更多还原