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沉积条件对氢化锂薄膜形貌和沉积速率的影响

Effect of deposition condition on morphology and deposition velocity of LiH films

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【作者】 雷洁红段涛闫正洲邢丕峰

【Author】 LEI Jie-hong~(1,3),DUAN Tao~2,YAN Zheng-zhou~1,XING Pi-feng~3 (1.Physics and Electronic Information Insitute,West China Normal University,Nanchong 637002,China; 2.Key Laboratory for Radioactive Waste and Environmental Security,Southwest University of Science and Technology,Mianyang 621010,China; 3. Research Center of Laser Fusion,Chinese Academy of Engineering Physics,Mianyang 621900,China)

【机构】 西华师范大学物理与电子信息学院中国工程物理研究院 激光聚变研究中心西南科技大学核废物与环境安全国防重点学科实验室中国工程物理研究院激光聚变研究中心

【摘要】 为了研究沉积条件对氢化锂薄膜沉积速率和表面形貌的影响,采用脉冲激光沉积方法在Si(100)基片上沉积了氢化锂薄膜。通过改变靶基距和氢压等手段来控制薄膜的沉积速率,得到了氢压与沉积速率和薄膜表面质量的关系。结果表明,随着氢压和靶基距的增加,氢化锂薄膜的沉积速率逐渐下降;适当增加氢压可以降低氢化锂薄膜的表面粗糙度。从薄膜生长机理出发,探讨了表面粗糙度与氢压的关系,发现理论与实验值的拟合结果非常接近。

【Abstract】 In order to study effect of deposition conditions on morphology and deposition velocity of LiH films,LiH films were prepared on Si(100) substrate by means of pulsed laser deposition.The deposition velocity of LiH films were controlled by changing the substrate-target distance and hydrogen pressure.The relations among hydrogen pressure,deposition velocity and surface quality of the films were obtained.The results showed that the deposition velocity of LiH films decreased with hydrogen pressure and substrate-target distance increasing,moreover,the surface roughness can be reduced by increasing the hydrogen pressure to a certain degree.The relation between surface roughness and hydrogen pressure was discussed based on the growth mechanism of films.The theoretical values are in good agreement with experimental values.

【基金】 国家八六三高技术研究发展计划资助项目;西华师范大学博士科研启动资金资助项目(10B014)
  • 【分类号】P512.2
  • 【下载频次】56
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