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介质阻挡放电诱导化学蒸气发生-ICP-OES测定痕量Se(IV)
Dielectric barrier discharge induced chemical vapor generation for determination of selenium(IV) by ICP-OES
【摘要】 本文将介质阻挡放电诱导化学蒸气发生与电感耦合等离子体原子发射光谱分析法联用,用于痕量Se(IV)的选择性测定。考察了介质阻挡放电诱导化学蒸气发生的主要影响因素。在最优的实验条件下,甲酸浓度为15%时,本方法对Se(IV)的检出限(3σ)为6μg.L-1,测定100μg.L-1Se(IV)溶液的相对标准偏差(n=11)为3.4%。该方法成功应用于多种水样中Se(IV)的测定。
【Abstract】 Dielectric barrier discharge induced chemical vapor generation for sensitive and selective determination of selenium(IV) was presented in this work.The main conditions for the proposed technique were investigated in detail.Under the optimized experimental conditions with formic acid concentration of 15%,a limit of detection(LOD,3σ) of 6 μg·L-1 was obtained,and the relative standard deviation(RSD) was 3.4% at the concentration level of 100 μg·L-1 Se(IV).The method was applied to the determination of Se(IV) in a certified reference water sample,tap water and mineral water samples with satisfactory results.
- 【文献出处】 化学研究与应用 ,Chemical Research and Application , 编辑部邮箱 ,2011年05期
- 【分类号】O657.31
- 【被引频次】14
- 【下载频次】186