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高TCR氧化钒薄膜研究进展

Development of high TCR vanadium oxide thin film

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【作者】 王彬赖建军陈四海

【Author】 Wang Bin1,2,Lai Jianjun1,2,Chen Sihai1,2(1.College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology,Wuhan 430074,China;2.Wuhan National Laboratory for Optoelectronics,Wuhan 430074,China)

【机构】 华中科技大学光电子科学与工程学院武汉光电国家实验室

【摘要】 氧化钒薄膜的高电阻温度系数(TCR)是制作高灵敏度非制冷红外探测器的一个极其重要的参量。探测器的响应率与TCR紧密相关。高TCR将提升红外探测器的探测性能。鉴于氧化钒薄膜TCR的重要性,综述了近几年国内外研究中制备高TCR氧化钒薄膜的新技术并分类归纳:包括离子束增强沉积(IBED)法,反应脉冲激光沉积技术等。由于氧化钒薄膜具有VO2、VO5等多种价态结构,不同的制备条件和方法所生成的氧化钒薄膜TCR大小也不同,因此,分析了相关技术方法的优缺点,并对高TCR进行了一定的理论解释。

【Abstract】 High temperature coefficient of resistance(TCR) of vanadium oxide thin film is a great important parameter in the fabrication process of high sensitive uncooled infrared detectors.The responsivity of detectors is closely related to TCR.The performance of infrared detectors can be enhanced with sensitive thin films of high TCR.Owing to the importance of TCR of vanadium oxide thin film,the worldwide researches to improve technical approaches that fabricate vanadium oxide thin film of high TCR in recent years were reviewed.These technologies included ion beam enhanced deposition,reactive pulsed laser deposition,and so on.Because of different V-O valence configurations such as VO2,VO5,in vanadium oxide films,different preparation conditions and methods would cause different TCR of vanadium oxide films.Therefore,the advantages and disadvantages of the related technical approaches were analyzed and theoretical explanations on high TCR were presented.

【关键词】 电阻温度系数氧化钒红外探测
【Key words】 TCRvanadium oxideinfrared detection
【基金】 国家863计划(2007AA03Z309)
  • 【文献出处】 红外与激光工程 ,Infrared and Laser Engineering , 编辑部邮箱 ,2011年05期
  • 【分类号】O484.1
  • 【被引频次】10
  • 【下载频次】276
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