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Accuracy and analysis of long-radius measurement with long trace profiler

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【作者】 叶海仙杨李茗

【Author】 Haixian Ye and Liming Yang Chengdu Fine Optical Engineering Research Center,Chengdu 610041,China

【机构】 Chengdu Fine Optical Engineering Research Center

【摘要】 The long trace profiler(LTP) is proposed to measure radius of curvature(R) and surface figure of a longradius spherical surface in an optical shop.Equipped with a motorized rotary stage and a two-dimensional tilt stage,the LTP scans the full aperture and calculates the absolute radius of curvature of each scanning line based on the least square method.Nonlinear error and manufacture error difference between center and the edge are obtained by comparing R results.The R-limit is validated and expressed as D/R,where D is the aperture of the mirror under test.A full-aperture three-dimensional figure is also reconstructed based on triangle interpolation.

【Abstract】 The long trace profiler(LTP) is proposed to measure radius of curvature(R) and surface figure of a longradius spherical surface in an optical shop.Equipped with a motorized rotary stage and a two-dimensional tilt stage,the LTP scans the full aperture and calculates the absolute radius of curvature of each scanning line based on the least square method.Nonlinear error and manufacture error difference between center and the edge are obtained by comparing R results.The R-limit is validated and expressed as D/R,where D is the aperture of the mirror under test.A full-aperture three-dimensional figure is also reconstructed based on triangle interpolation.

【基金】 supported by the Two Hun-dreds Human Resource Foundation of China Academy of Engineering Physics
  • 【文献出处】 Chinese Optics Letters ,中国光学快报(英文版) , 编辑部邮箱 ,2011年10期
  • 【分类号】TH74
  • 【被引频次】4
  • 【下载频次】46
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