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p-i-n型非晶硅薄膜电池p层材料制备及光学性能研究

Fabrication and optical properties of p-type layer in p-i-n film cells based on amorphous silicon

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【作者】 汪沁郭涛张峰李伟

【Author】 WANG Qin*1,GUO Tao1,ZHANG Feng1,LI Wei21.School of Optoelectronic Information,University of Electronic Science and Technology of China,Chengdu 610054,China;2.State Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of China,Chengdu 610054,China

【机构】 电子科技大学光电信息学院电子科技大学电子薄膜与集成器件国家重点实验室

【摘要】 采用射频等离子体增强化学气相沉积(RF-PECVD)方法制备非化学计量比氢化非晶碳化硅(a-SiC:H)薄膜材料,借助紫外可见(UV-Vis)光谱、激光拉曼(Raman)光谱和傅里叶变换红外(FTIR)光谱等手段,研究了p-i-n型非晶硅(a-Si:H)薄膜太阳能电池p层a-SiC:H薄膜材料的制备与光学性能.研究结果表明甲烷和硅烷掺杂比能影响a-Si:H薄膜成键情况,而射频功率一定程度上能影响薄膜沉积速率,该研究结果可为制备转换效率高、性能稳定的p-i-n型非晶硅薄膜太阳能电池提供支持.

【Abstract】 Non-stoichiometry hydrogenated amorphous silicon carbide(a-SiC:H) thin films were deposited by radio frequency plasma enhanced chemical vapor deposition(RF-PECVD).The fabrication and optical properties of p-type layer in p-i-n film cells based on amorphous silicon were investigated by means of ultraviolet-visible(UV-Vis),laser Raman and Fourier transform infrared(FTIR) spectroscopy,respectively.The results show that CH4 and SiH4 flow ratios can affect the bonding of a-SiC:H thin film,and radio-frequency power can affect the deposition rate of the thin layer to some extent.The research results can give practical support for the application of p-i-n film cells based on amorphous silicon with high energy transfer efficiency and stable optical properties.

【基金】 教育部重点实验室资助项目(J2009JBPY003);国家大学生创新性实验计划资助项目(091061424)
  • 【文献出处】 大连理工大学学报 ,Journal of Dalian University of Technology , 编辑部邮箱 ,2011年S1期
  • 【分类号】O484.41
  • 【下载频次】405
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