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室温下高速沉积AZO薄膜的研究
Study of AZO Thin Films Deposited at Room Temperature with High Rate
【摘要】 在室温下,采用射频磁控溅射技术以较大的功率密度(7W/cm2)沉积了一系列掺铝氧化锌(AZO)透明导电薄膜,探索了溅射压强对沉积速率及薄膜性能的影响。结果表明,当工作压强为2.0Pa时,高速(67nm/min)沉积得到的薄膜的电阻率为2.63×10-3Ω.cm,可见光平均透过率为83%,并且在薄膜表面有一定的织构。
【Abstract】 A series of aluminium-doped zinc oxide(AZO) films were prepared by radio-frequency magnetron sputtering deposition system with high power density at room tempereature.Effects of pressure on the deposition rate and properties of the films were investigated.Low resitivity of 2.63×10-3Ω·cm and high average visible transmittance about 83% are obtained at the working pressure of 2.0Pa with a high depositon rate of 67nm/min,some surface textures are formed.
【关键词】 室温;
压强;
AZO;
高速;
磁控溅射;
【Key words】 room temperature; pressure; AZO; high rate; magnetron sputtering;
【Key words】 room temperature; pressure; AZO; high rate; magnetron sputtering;
【基金】 中央高校基本科研业务费专项资金(2011YYL006);中国科学院半导体材料科学重点实验室开放基金(KLSMS-0907)
- 【文献出处】 材料导报 ,Materials Review , 编辑部邮箱 ,2011年S2期
- 【分类号】TB383.2
- 【被引频次】2
- 【下载频次】93