【摘要】 在电子系统高功率微波效应试验研究中,获取待测器件损伤效应阈值需要在多种参数条件下进行研究.损伤性试验是破坏性的,样本无法重复使用,昂贵的费用往往导致试验样本数很少,给试验参数的选取造成极大限制.采用了一种基于"均匀设计"的试验参数选取方法,使用该方法可以避免在损伤效应试验中参数选取的随意性,以提高试验的效费比.基于该方法对原某集成电路试验进行设计,结果表明在采用该方法的基础之上可使费用降低27%,而且处理使用该方法获得的数据时,可以借助成熟的方法,提高数据分析效率.更多还原

【Abstract】 In the experimental study on high-power microwave effects of electronic systems,the damage threshold of DUT(device under test)must be obtained based on a number of HPM parameters and injured devices.We have to adopt small sample number in the experiment because of the expensive cost.Therefore,it is difficult to enhance the confidence of experimental results.A method of experimental parameters selection based on uniform desigh(UD)is described.This method has its own characteristics with less sample size compared with other experimental design methods.One can avoid the arbitrariness of parameters selection in the experiment and enhances the experiment benefit-cost ratio by using this method.The result shows that 27% of the cost will be reduced in the IC damage experiment.更多还原