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毫米波椭偏法测量介质的复介电常数
Ellipsometry for Measurement of Complex Permittivity of Materials in Millimeter-Wave Band
【摘要】 将椭圆偏振测量法(椭偏法)的电磁频谱从原来可见光、红外波段拓展到毫米波段,对毫米波椭偏法测量原理进行理论分析,使用已构建的实验装置进行测量.通过对测量结果的分析,选择合适的入射角,经过大量测试,计算出被测介质材料的复介电常数.
【Abstract】 The electromagnetic frequency band of ellipsometry is extended from visible light and infrared band to millimeter-wave band.We analyze the measurement principle of ellipsometry in millimeter-wave band,and carry out experiments using a self-built measurement apparatus.From the measured results,an appropriate incident angle is chosen.We obtain complex permittivity of materials based on a large amount of measured data.
【关键词】 复介电常数;
椭圆偏振测量法(椭偏法);
反射系数;
毫米波;
【Key words】 complex permittivity; ellipsometry; reflection coefficient; millimeter-wave;
【Key words】 complex permittivity; ellipsometry; reflection coefficient; millimeter-wave;
【基金】 国家自然科学基金资助项目(60571054);上海大学研究生创新基金资助项目(SHUCX080153);上海市教委支出预算资助项目(2008101)
- 【文献出处】 上海大学学报(自然科学版) ,Journal of Shanghai University(Natural Science Edition) , 编辑部邮箱 ,2010年04期
- 【分类号】TN015
- 【被引频次】1
- 【下载频次】172