【摘要】 闩锁效应是CMOS集成电路在实际应用中失效的主要原因之一,本文从CMOS集成电路工艺结构出发,详细地分析了闩锁效应的形成机理,并从版图和工艺设计两方面总结了几种抑制闩锁效应的关键技术。更多还原

【Abstract】 Latch-up is one of main cause that CMOS IC becomes invalid in application,the paper analyzed the mechanism of latch-up in detail,and sums up several kinds of key technology to prevent latch-up from layout and technics design.更多还原