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Si纳米线阵列波导光栅制备

Fabrication of a Si nanowire arrayed waveguide grating

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【作者】 张家顺安俊明赵雷宋世娇吴远大胡雄伟

【Author】 ZHANG Jia-shun,AN Jun-ming,ZHAO Lei,SONG Shi-jiao, WU Yuan-da,HU Xiong-wei (State Key Laboratory on Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China)

【机构】 中国科学院半导体研究所集成光电子国家重点实验室

【摘要】 采用绝缘层上Si(SOI)材料设计制备了3×5纳米线阵列波导光栅(AWG),器件大小为110μm×100μm。利用简单传输法模拟了器件的传输谱,并采用二维时域有限差分(FDTD)模拟中心通道输出光场的稳态分布,模拟结果表明,器件的通道间隔为11 nm,通道间的串扰为18 dB。通过电子束曝光(EBL)和感应耦合等离子(ICP)刻蚀制备了所设计的器件,光输出谱测试分析表明,器件中心通道的片上损耗为9 dB,通道间隔为8.36~10.40 nm,中心输出通道的串扰为6 dB。在误差允许范围内,设计和测试的结果一致。

【Abstract】 A 110 μm×100 μm ultracompact 3×5 arrayed waveguide grating(AWG) demultiplexer is designed and fabricated based on Si on insulator(SOI) nanowire.The transmission spectra are simulated by the simple transmission function,and the stable output optical field distribution is simulated by 2D finite difference time domain(FDTD).The simulated results show that the device is designed with a channel spacing of 11 nm and crosstalk of 18 dB.The device is fabricated on a silicon-on-isolator(SOI) substrate by electron beam lithography(EBL) and inductively coupled plasma(ICP) etching.The demultiplexing characteristics are observed with a channel spacing of 8.36-10.4 nm,crosstalk of about 6 dB and a loss of about 9 dB for the central channel.The test results are consistent with the design results in the error range.

【基金】 科技部“863”计划资助项目(2006AA03Z420);国家自然科学基金资助项目(60776057,60837001,60877014)
  • 【文献出处】 光电子.激光 ,Journal of Optoelectronics.Laser , 编辑部邮箱 ,2010年10期
  • 【分类号】TN252
  • 【被引频次】5
  • 【下载频次】213
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