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填料长径比对导电胶渗流阈值的影响

Influence of slenderness ratio on the percolation threshold of conductive adhesives

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【作者】 陶宇夏艳平张国庆吴希俊苏浩梁平辉吴海平陶国良

【Author】 TAO Yu 1,XIA Yanping1,ZHANG Guoqing2,WU Xijun3,SU Hao4,LIANG Pinghui4,WU Haiping1,2,TAO Guoliang1(1.Laboratory of Micro-and Nano-Composite Materials,Jiangsu Polytechnic University,Changzhou 213164,China;2.Key Laboratory of Advanced Textile Materials and Manufacturing Technology,Zhejiang Sci-Tech University,Hangzhou 310018,China;3.Center of Nano-Science and Nano-Technology,Zhejiang University,Hangzhou 310027,China;4.ChangShu Jiafa Chemistry,Suzhou 215533,China)

【机构】 江苏工业学院材料学院浙江理工大学先进纺织材料与制备技术教育部重点实验室浙江大学材料与化学工程学院常熟佳发化学有限责任公司

【摘要】 采用微波辅助乙二醇还原法制备了不同长径比的银纳米方块及银纳米线,并对其进行了SEM、XRD表征。以不同长径比银纳米线作为导电填料制备了各向同性导电胶。对导电胶的填充渗流阈值的研究发现,填料的长径比对填充渗流阈值的影响很大,长径比越大,渗流阈值越小。运用修正的阈值理论对这一实验现象进行了合理解释,模拟结果表明修正的阈值理论与实验结果非常吻合。

【Abstract】 Nanostructured silver with different slenderness ratio was prepared by a microwave(MW) assisted method.The nano-silvers were characterized by scanning electron microscope(SEM) and X-ray diffraction(XRD).Isotropical conductive adhesive(ICA) was prepared by using the different slenderness ratio nano-silver as the conductive filler.The conductivity of the adhesive was measured by four-points method.The results indicate that the slenderness ratio of the nano-silver has important influence on it’s percolation threshold.A feasible modified threshold theory was put forward to simulate the relationship between ratio and threshold.The simulation results agree well with the experimental results.

【基金】 江苏省基础研究计划(BK2009570);教育部重点实验室开放基金(2008005);常州市工业科技攻关(CE20090043);国家自然科学基金(59971045)
  • 【文献出处】 复合材料学报 ,Acta Materiae Compositae Sinica , 编辑部邮箱 ,2010年06期
  • 【分类号】TB383.1
  • 【被引频次】21
  • 【下载频次】688
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