【摘要】 电子断层扫描术(ET)是在透射电镜基础上发展出来的一种更为先进的表征手段,能有效地在不同尺度上解析多种材料的三维结构,利用一系列不同角度的倾转照片进行三维重构。ET技术最先应用于生物和医学等领域,目前正逐步发展并推广到材料科学研究领域用以研究纳米材料的形貌和结构。本文作者利用此技术得到不足1nm厚度的超薄ET切片,完全消除了样品厚度影响,揭示了隐藏在介孔材料内部的结构特征,成功地解析了复杂的介观结构。更多还原

【Abstract】 Electron tomography(ET) is a rapidly developing technique that is used to acquire the reconstructed complex 3D structures from a tilt series of TEM images.ET was first used in biology to understand cell organelles,subcellular aggregates,and whole cells.Recently,the technique has been increasingly applied in material science to study the morphology and structure of nanomaterials.Herein,we used the state-of-the-art ET technique to obtain tomographic slices with a thickness of less than 1 nm,which eliminate sample thickness effect,so that the structural characteristics "hidden" in the interior of selected mesostructured objects can be captured.更多还原