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AgSnO2触头材料电弧侵蚀特征的分子动力学模拟
Molecular Dynamics Simulation for Arc Erosion Morphology of AgSnO2 Materials
【摘要】 研究电接触材料电弧侵蚀作用过程中灭弧过程的微观机理,采用分子动力学和实验的方法对反应合成的AgSnO2电接触材料的熔池行为进行模拟。结果表明:根据起弧时的物相所构建的模型,能够准确地模拟熔池特征,熔池内部物质运动和存在状态是决定耐电弧侵蚀的关键因素。可通过增加反应合成AgSnO2电接触材料与基体浸润的氧化物组分,以及氧化物发生物态变化、化学分解过程来达到熄弧的目的。
【Abstract】 AgSnO2 electrical contact material molten pool was simulated by Molecular Dynamics in order to study the microscopic mechanism for the arc quenching.The result shows that the model can simulate the characteristic of molten pool effectively which were set according to the molten pool phase,and the material movement and existing state are the key factors for electrical erosion resistance.Arc quenching can be realized by increaseing the oxygen composition in AgSnO2 electrical contact material,and the oxygen occur resolution reaction and phase change.
【Key words】 AgSnO2 electrical contact material; arc erosion; molecular dynamics; molten pool;
- 【文献出处】 材料工程 ,Journal of Materials Engineering , 编辑部邮箱 ,2010年03期
- 【分类号】TM24
- 【被引频次】18
- 【下载频次】332