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一种适用于高速CMOS图像传感器中的采样保持电路设计

Design of a Sample-and-Hold Circuit for High Speed CMOS Image Sensor

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【作者】 蔡坤明丁扣宝罗豪韩雁

【Author】 CAI Kunming,DING Koubao* ,LUO Hao,HAN Yan ( Institute of Microelectronics and Optoelectronics,Zhejiang University,Hangzhou 310027,China)

【机构】 浙江大学微电子与光电子研究所

【摘要】 设计了一种适用于高速CMOS图像传感器中积分器阵列的采样保持电路。在采样保持电路的保持路径中采用一种抑制衬底偏压效应的T型开关,取代传统的CMOS传输门开关,可以抑制衬底偏压效应带来的阈值变化,保证开关导通电阻的线性度,同时由于在开关设计中引入了T型结构,减少高速输入下寄生电容引入的信号馈通效应,可以实现更为优化的关断隔离。基于SMIC(中芯国际)0.13μm标准CMOS工艺设计了一个适用于高速采样积分器阵列中的CMOS采样保持电路。Cadence Spectre仿真结果表明在输入信号达到奈奎斯特频率时,电路信噪失真比(SINAD)达到了85.5dB,无杂散动态范围(SFDR)达到92.87dB,而功耗仅为32.8mW。

【Abstract】 A sample-and-hold circuit utilized in high speed integrator array is designed. A new T type switch which can restrain the substrate biasing effect is designed to replace the traditional CMOS transmission gate switch. Thus, the linearity of the switch’s turn-on resistance can be assured because the changes of threshold voltage caused by the substrate biasing effect is limited. Also,this new T type structure can reduce the charge feed through effect under high frequency input,thus,a better turn-off isolation characteristic can be achieved . Based on SMIC 0. 13 μm Standard CMOS technique,a sample-and-hold circuit applicable to the CMOS image sensor is designed. Spectre simulation results show that the Signal-to-Noise Distortion Ratio and Spurs Free Dynamic Range is 85. 5 dB and 92. 87 dB respectively under the Nyquist input frequency,the power consumption is only 32. 8 mW.

  • 【文献出处】 传感技术学报 ,Chinese Journal of Sensors and Actuators , 编辑部邮箱 ,2010年07期
  • 【分类号】TP212
  • 【被引频次】1
  • 【下载频次】237
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