节点文献

Design of a high-performance PJFET for the input stage of an integrated operational amplifier

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 税国华; 唐昭焕; 王志宽; 欧红旗; 杨永晖; 刘勇; 王学毅;

【Author】 Shui Guohua Tang Zhaohuan Wang Zhikuan Ou Hongqi Yang Yonghui Liu Yong Wang Xueyi (1 Sichuan Institute of Solid-State Circuits,CETC,Chongqing 400060,China) (2 National Laboratory of Analog ICs,Chongqing 400060,China)

【机构】 Sichuan Institute of Solid-State Circuits,CETC; National Laboratory of Analog ICs; National Laboratory of Analog ICs,Chongqing 400060 China;

【摘要】 <正>With Shockley’s approximate-channel theory and TCAD tools,a high-voltage,ultra-shallow junction PJFET for the input stage of an integrated operational amplifier(OPA) was realized.The high-performance PJFET device was developed in the Bi-FET process technology.The measured specifications are as follows.The top-gate junction depth is about 0.1μm,the gate-leakage current is less than 5 pA,the breakdown voltage is more than 80 V, and the pinch-offvoltage is optional between 0.8 and 2.0 V.The device and its Bi-FET process technology were used to design and process a high input-impedance integrated OPA.The measured results show that the OPA has a bias current of less than 50 pA,voltage noise of less than 50 nV/Hz1/2,and current noise of less than 0.05 pA/Hz1/2.

【Abstract】 With Shockley’s approximate-channel theory and TCAD tools,a high-voltage,ultra-shallow junction PJFET for the input stage of an integrated operational amplifier(OPA) was realized.The high-performance PJFET device was developed in the Bi-FET process technology.The measured specifications are as follows.The top-gate junction depth is about 0.1μm,the gate-leakage current is less than 5 pA,the breakdown voltage is more than 80 V, and the pinch-offvoltage is optional between 0.8 and 2.0 V.The device and its Bi-FET process technology were used to design and process a high input-impedance integrated OPA.The measured results show that the OPA has a bias current of less than 50 pA,voltage noise of less than 50 nV/Hz1/2,and current noise of less than 0.05 pA/Hz1/2.

【基金】 supported by the Innovative Fund of the China Electronics Technology Group Corporation(CETC)(No.GJ0708020).
  • 【文献出处】 半导体学报 ,Journal of Semiconductors , 编辑部邮箱 ,2010年01期
  • 【分类号】TN722.77
  • 【被引频次】2
  • 【下载频次】113
节点文献中: 

本文链接的文献网络图示:

本文的引文网络